Measurement of atomic lifetimes in Neon I and Argon I using pulsed rf

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dc.contributor.advisor Hults, Malcom E. en_US Tews, Daniel L., 1946- en_US 2011-06-03T19:31:02Z 2011-06-03T19:31:02Z 1973 en_US 1973
dc.identifier LD2489.Z78 1973 .T49 en_US
dc.description.abstract Atomic lifetimes of selected levels in Neon I and Argon I were measured using a method of delayed coincidence. Pulsed rf was used to excite a discharge tube containing the neon and argon gas. The radiation emitted from the excited atoms of the gas was passed through a monochromator so only the desired wavelength would be observed. Each time an excitation pulse ended, the decay of light intensity was detected by a photomultiplier tube. By measuring the decay time of the light intensity using the delayed coincidence technique, the average lifetime of the desired level was determined. The values of lifetimes determined in this study were found to contain considerable error. Several factors contributing to these errors were thought to be the shape of the rf pulses and an effort known as cascading which was caused by the use of rf for excitation of the gas.
dc.format.extent v, 68 leaves : ill. ; 28 cm. en_US
dc.source Virtual Press en_US
dc.subject.lcsh Neon -- Isotopes -- Decay. en_US
dc.subject.lcsh Argon -- Isotopes -- Spectra. en_US
dc.subject.lcsh Exciton theory. en_US
dc.title Measurement of atomic lifetimes in Neon I and Argon I using pulsed rf en_US Thesis (M.S.)
dc.identifier.cardcat-url en_US

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  • Master's Theses [5510]
    Master's theses submitted to the Graduate School by Ball State University master's degree candidates in partial fulfillment of degree requirements.

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